Electrical and Optical Properties of Stacking Faults in 4H-SiC Devices

• 作者Bin Chen; Jun Chen; Takashi Sekiguchi; Takasumi Ohyanagi; Hirofumi Matsuhata; Akimasa Kinoshita; Hajime Okumura
• 卷第39卷
• 期第6期
• 印刷ISSN0361-5235
• 电子ISSN1543-186X
• 文件大小388.12KB
• 发表时间2010-06
• DOI10.1007/s11664-010-1168-6
• 页码684-687