Determination of dielectric constant and loss of high-K thin films in the microwave frequencies

• 作者K. Sudheendran; D. Pamu; M. Ghanashyam Krishna; K.C. James Raju
• 卷第43卷
• 期第4期
• 印刷ISSN0263-2241
• 文件大小525.14KB
• 发表时间2010
• DOI10.1016/j.measurement.2009.12.026
• 页码556-562