A model based reconstruction technique for depth sectioning with scanning transmission electron microscopy

• 作者W. Van den Broek; S. Van Aert; D. Van Dyck
• 卷第110卷
• 期第5期
• 印刷ISSN0304-3991
• 文件大小512.96KB
• 发表时间2010
• DOI10.1016/j.ultramic.2009.09.008
• 页码548-554