[IEEE 2011 IEEE International Joint Conference on Biometrics (IJCB) - Washington, DC, USA (2011.10.11-2011.10.13)] 2011 International Joint Conference on Biometrics (IJCB) -
Parris, Jon; Wilber, Michael; Heflin, Brian; Rara, Ham; El-barkouky, Ahmed; Farag, Aly; Movellan, Javier; Anonymous, ; Castrilon-Santana, Modesto; Lorenzo-Navarro, Javier; Teli, Mohammad Nayeem; Marcel, Sebastien; Atanasoaei, Cosmin; Boult, T.E.
- 作者Parris, Jon; Wilber, Michael; Heflin, Brian; Rara, Ham; El-barkouky, Ahmed; Farag, Aly; Movellan, Javier; Anonymous, ; Castrilon-Santana, Modesto; Lorenzo-Navarro, Javier; Teli, Mohammad Nayeem; Marcel, Sebastien; Atanasoaei, Cosmin; Boult, T.E.
- 文件大小1417.89KB
- 发表时间2011
- DOI10.1109/ijcb.2011.6117593
- 页码1-10