SPIE Proceedings [SPIE SPIE OPTO - San Francisco, California (Saturday 22 January 2011)] Gallium Nitride Materials and Devices VI - Unified model for the GaN LED efficiency droop
Piprek, Joachim; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; Piprek, Joachim; Yoon, Euijoon
- 作者Piprek, Joachim; Chyi, Jen-Inn; Nanishi, Yasushi; Morkoç, Hadis; Piprek, Joachim; Yoon, Euijoon
- 卷第7939卷
- 印刷ISSN0277-786X
- 文件大小271.51KB
- 发表时间2011
- DOI10.1117/12.871105