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$Histologic analysis of a 2,940 nm fractional device$

Histologic analysis of a 2,940 nm fractional device

David A. Kist; Courtney M.L. Elm; Lydia I. Eleftheriou; Jessica A. Studer; Irmina D. Wallander; Susan E. Walgrave; Brian D. Zelickson

作者David A. Kist; Courtney M.L. Elm; Lydia I. Eleftheriou; Jessica A. Studer; Irmina D. Wallander; Susan E. Walgrave; Brian D. Zelickson
卷第43卷
期第2期
印刷ISSN0196-8092
电子ISSN1096-9101
文件大小4995.35KB
发表时间2011
DOI10.1002/lsm.21020
页码79-91

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