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[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Designing a fast and adaptive error correction scheme for increasing the lifetime of phase change memories

[IEEE 2011 IEEE VLSI Test Symposium (VTS) - Dana Point, CA, USA (2011.05.1-2011.05.5)] 29th VLSI Test Symposium - Designing a fast and adaptive error correction scheme for increasing the lifetime of phase change memories

Datta, Rudrajit; Touba, Nur A.

作者Datta, Rudrajit; Touba, Nur A.
文件大小752.01KB
发表时间2011
DOI10.1109/vts.2011.5783773
页码134-139

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