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SPIE Proceedings [SPIE SPIE Optical Systems Design - Marseille, France (Monday 5 September 2011)] Advances in Optical Thin Films IV - <title>Resonances determination in microstructured films embedded in multilayered stacks</title>

SPIE Proceedings [SPIE SPIE Optical Systems Design - Marseille, France (Monday 5 September 2011)] Advances in Optical Thin Films IV - Resonances determination in microstructured films embedded in multilayered stacks

Vial, Benjamin; Commandré, Mireille; Zolla, Frédéric; Nicolet, André; Tisserand, Stephane; Lequime, Michel; Macleod, H. Angus; Ristau, Detlev
  • 作者Vial, Benjamin; Commandré, Mireille; Zolla, Frédéric; Nicolet, André; Tisserand, Stephane; Lequime, Michel; Macleod, H. Angus; Ristau, Detlev
  • 卷第8168卷
  • 印刷ISSN0277-786X
  • 文件大小1173.65KB
  • 发表时间2011
  • DOI10.1117/12.897347
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