[IEEE 2011 IEEE AUTOTESTCON - Baltimore, MD, USA (2011.09.12-2011.09.15)] 2011 IEEE AUTOTESTCON - Polymorphic Analog Instrument Environment
- 作者Lind, David; Haney, Mike; Healey, Ryan
- 文件大小867.15KB
- 发表时间2011
- DOI10.1109/AUTEST.2011.6058765
- 页码254-258
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