Reducing Stacking Faults in Highly Doped N-Type 4H-SiC Crystal
Kojima, Kazutoshi; Kato, Tomohisa; Ito, Sachiko; Kojima, Jun; Hirose, Fusao; Kito, Yasuo; Yamauchi, Shoichi; Nishikawa, K.; Adachi, Ayumu
- 期刊名称Materials Science Forum
- 作者Kojima, Kazutoshi; Kato, Tomohisa; Ito, Sachiko; Kojima, Jun; Hirose, Fusao; Kito, Yasuo; Yamauchi, Shoichi; Nishikawa, K.; Adachi, Ayumu
- 电子ISSN1662-9752
- 文件大小874.62KB
- 发表时间2011-3
- DOI10.4028/www.scientific.net/MSF.679-680.8
- 页码8-11