[IEEE Integrity (RAMS) - Lake Buena Vista, FL, USA (2011.01.24-2011.01.27)] 2011 Proceedings - Annual Reliability and Maintainability Symposium - Improvements in estimating software reliability from growth test data
Dwyer, Dave; D'Onofrio, Paul
- 作者Dwyer, Dave; D'Onofrio, Paul
- 文件大小459.28KB
- 发表时间2011
- DOI10.1109/RAMS.2011.5754434
- 页码1-5