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[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Smart power technologies on SOI

[IEEE 2011 International Symposium on VLSI Design, Automation and Test (VLSI-DAT) - Hsinchu, Taiwan (2011.04.25-2011.04.28)] Proceedings of 2011 International Symposium on VLSI Design, Automation and Test - Smart power technologies on SOI

Wessels, Piet

作者Wessels, Piet
文件大小127.42KB
发表时间2011
DOI10.1109/VDAT.2011.5783571
页码1-2

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