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[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Applications of C-AFM analysis techniques at advanced IC on ATPG/Scan failure

[IEEE 2011 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA 2011) - Incheon, Korea (South) (2011.07.4-2011.07.7)] 18th IEEE International Symposium on the Physical and Failure Analysis of Integrated Circuits (IPFA) - Applications of C-AFM analysis techniques at advanced IC on ATPG/Scan failure

Chee Hong Chong, ; Wilson Lee Cheng Hoe, ; Ren De Lin, ; Hong Bo Zhang,

作者Chee Hong Chong, ; Wilson Lee Cheng Hoe, ; Ren De Lin, ; Hong Bo Zhang,
文件大小1890.51KB
发表时间2011
DOI10.1109/ipfa.2011.5992735
页码1-4

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