[IEEE 2011 IEEE International Electron Devices Meeting (IEDM) - Washington, DC, USA (2011.12.5-2011.12.7)] 2011 International Electron Devices Meeting - Performance limits of superlattice-based steep-slope nanowire FETs
Gnani, E.; Maiorano, P.; Reggiani, S.; Gnudi, A.; Baccarani, G.
- 作者Gnani, E.; Maiorano, P.; Reggiani, S.; Gnudi, A.; Baccarani, G.
- 文件大小2095.85KB
- 发表时间2011
- DOI10.1109/iedm.2011.6131491