[IEEE 2011 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Napa Valley, CA, USA (2011.11.9-2011.11.11)] 2011 IEEE International High Level Design Validation and Test Workshop - Introducing XCS to Coverage Directed test Generation
Ioannides, Charalambos; Barrett, Geoff; Eder, Kerstin
- 作者Ioannides, Charalambos; Barrett, Geoff; Eder, Kerstin
- 文件大小841.77KB
- 发表时间2011
- DOI10.1109/hldvt.2011.6114166
- 页码57-64