[IEEE 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems (DFT) - Vancouver, BC, Canada (2011.10.3-2011.10.5)] 2011 IEEE International Symposium on Defect and Fault Tolerance in VLSI and Nanotechnology Systems - Generating Burst-Error Correcting Codes from Orthogonal Latin Square Codes -- A Graph Theoretic Approach
- 作者Datta, Rudrajit; Touba, Nur A.
- 文件大小324.42KB
- 发表时间2011
- DOI10.1109/DFT.2011.3
- 页码367-373
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