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[IEEE 2011 IEEE Pulsed Power Conference (PPC) - Chicago, IL, USA (2011.06.19-2011.06.23)] 2011 IEEE Pulsed Power Conference - Test for end connection integrity of metalized film capacitors

[IEEE 2011 IEEE Pulsed Power Conference (PPC) - Chicago, IL, USA (2011.06.19-2011.06.23)] 2011 IEEE Pulsed Power Conference - Test for end connection integrity of metalized film capacitors

Qin, Shanshan; Qi, Xiaoguang; Jow, Richard; Boggs, Steven
  • 作者Qin, Shanshan; Qi, Xiaoguang; Jow, Richard; Boggs, Steven
  • 文件大小1349.81KB
  • 发表时间2011
  • DOI10.1109/ppc.2011.6191563
  • 页码684-687
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