Guest Reviewers
- 期刊名称Journal of Applied Behavior Analysis
- 卷第44卷
- 期第3期
- 印刷ISSN0021-8855
- 电子ISSN1938-3703
- 文件大小32.06KB
- 发表时间2011
- DOI10.1901/jaba.2011.44-670
- 页码670-670
[IEEE Proceedings of NAECON '93 - National Aerospace and Electronics Conference - Dayton, OH, USA (1993.05.24-1993.05.28)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Proceedings of NAECON '93 - National Aerospace and Electronics Conference1993
[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Employment assistance for IEEE membersShowalter, A.B. · 1993
[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - ARTIP status reportLeahy, M.B. · 1993
[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Layered irredundant coveringDasigi, V. · 1993
[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Automated focus determinationWeideman, D. · 1993
[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Militarized touchstone programBlitzer, F. · 1993
[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Career and life assessmentKostek, P.J. · 1993
[IEEE IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Dayton, OH, USA (24-28 May 1993)] Proceedings of the IEEE 1993 National Aerospace and Electronics Conference-NAECON 1993 - Mission relevant testingLopez, M.; Horman, M.; Luu, T.; Orlando, H. · 1993