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In Situ Characterization of Thin Film Growth || X-ray photoelectron spectroscopy (XPS) for in situ characterization of thin film growth

In Situ Characterization of Thin Film Growth || X-ray photoelectron spectroscopy (XPS) for in situ characterization of thin film growth

Bluhm, H.
  • 作者Bluhm, H.
  • 文件大小1530.72KB
  • 发表时间2011
  • DOI10.1533/9780857094957.2.75
  • 页码75-98
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