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Time-frequency analysis for microwave reflectometry data processing in the HL-2A tokamak

Time-frequency analysis for microwave reflectometry data processing in the HL-2A tokamak

Zhong, W. L.; Shi, Z. B.; Zou, X. L.; Ding, X. T.; Huang, X. L.; Dong, Y. B.; Liu, Z. T.; Xiao, W. W.; Ji, X. Q.; Cui, Z. Y.; Liu, Yi; Yan, L. W.; Yang, Q. W.; Duan, X. R.
  • 期刊名称Review of Scientific Instruments
  • 作者Zhong, W. L.; Shi, Z. B.; Zou, X. L.; Ding, X. T.; Huang, X. L.; Dong, Y. B.; Liu, Z. T.; Xiao, W. W.; Ji, X. Q.; Cui, Z. Y.; Liu, Yi; Yan, L. W.; Yang, Q. W.; Duan, X. R.
  • 卷第82卷
  • 期第10期
  • 印刷ISSN0034-6748
  • 文件大小1684.89KB
  • 发表时间2011
  • DOI10.1063/1.3657157
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