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In Situ Characterization of Thin Film Growth || In situ spectroscopic ellipsometry (SE) for characterization of thin film growth

In Situ Characterization of Thin Film Growth || In situ spectroscopic ellipsometry (SE) for characterization of thin film growth

Hilfiker, J.N.
  • 作者Hilfiker, J.N.
  • 文件大小1762.09KB
  • 发表时间2011
  • DOI10.1533/9780857094957.2.99
  • 页码99-151
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