[IEEE 2011 IEEE 20th International Symposium on Industrial Electronics (ISIE) - Gdansk, Poland (2011.06.27-2011.06.30)] 2011 IEEE International Symposium on Industrial Electronics - Rdson behavior in various MOSFET families

• 作者Petit, Pierre; Aillerie, Michel; Zegaoui, Abdallah; Sawicki, Jean-Paul; Charles, Jean-Pierre
• 文件大小770.63KB
• 发表时间2011
• DOI10.1109/isie.2011.5984184
• 页码353-357