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High-throughput characterization of film thickness in thin film materials libraries by digital holographic microscopy

High-throughput characterization of film thickness in thin film materials libraries by digital holographic microscopy

Lai, Yiu Wai; Krause, Michael; Savan, Alan; Thienhaus, Sigurd; Koukourakis, Nektarios; Hofmann, Martin R; Ludwig, Alfred
  • 期刊名称Science and Technology of Advanced Materials
  • 作者Lai, Yiu Wai; Krause, Michael; Savan, Alan; Thienhaus, Sigurd; Koukourakis, Nektarios; Hofmann, Martin R; Ludwig, Alfred
  • 卷第12卷
  • 期第5期
  • 印刷ISSN1468-6996
  • 电子ISSN1878-5514
  • 文件大小1075.52KB
  • 发表时间2011-10-01
  • DOI10.1088/1468-6996/12/5/054201
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