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Influence of process parameters on structure and optical properties of GeC thin films deposited by RF magnetron sputtering

Influence of process parameters on structure and optical properties of GeC thin films deposited by RF magnetron sputtering

C.N. Zoita; C.E.A. Grigorescu; I.C. Vasiliu; I.D. Feraru
  • 作者C.N. Zoita; C.E.A. Grigorescu; I.C. Vasiliu; I.D. Feraru
  • 卷第519卷
  • 期第12期
  • 印刷ISSN0040-6090
  • 文件大小411.29KB
  • 发表时间2011
  • DOI10.1016/j.tsf.2011.01.204
  • 页码4101-4104
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