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Structural Dependence of Grain Boundary Resistivity in Copper Nanowires

Structural Dependence of Grain Boundary Resistivity in Copper Nanowires

T. Kim; D. M. Nicholson; X. Zhang; B. M. Evans; N. S. Kulkarni; E. A. Kenik; H. M. Meyer; B. Radhakrishnan; A. Li
  • 作者T. Kim; D. M. Nicholson; X. Zhang; B. M. Evans; N. S. Kulkarni; E. A. Kenik; H. M. Meyer; B. Radhakrishnan; A. Li
  • 文件大小282.70KB
  • 发表时间2011
  • DOI10.1143/JJAP.50.08LB09
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