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SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Micro- and Nanotechnology Sensors, Systems, and Applications III - <title>Programmatic perspectives with technical examples for THz materials characterization</title>

SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida (Monday 25 April 2011)] Micro- and Nanotechnology Sensors, Systems, and Applications III - Programmatic perspectives with technical examples for THz materials characterization

Buchwald, Walter; George, Thomas; Islam, M. Saif; Dutta, Achyut K.

作者Buchwald, Walter; George, Thomas; Islam, M. Saif; Dutta, Achyut K.
卷第8031卷
印刷ISSN0277-786X
文件大小1803.75KB
发表时间2011
DOI10.1117/12.884599

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