$In Situ Characterization of Thin Film Growth || Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth$

In Situ Characterization of Thin Film Growth || Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth

Koster, G.

作者Koster, G.
文件大小1701.38KB
发表时间2011
DOI10.1533/9780857094957.1.3
页码3-28

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In Situ Characterization of Thin Film Growth || Reflection high-energy electron diffraction (RHEED) for in situ characterization of thin film growth