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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Dimensional Optical Metrology and Inspection for Practical Applications - Experimental exploration of the correlation coefficient of static speckles in Fresnel configuration

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Dimensional Optical Metrology and Inspection for Practical Applications - Experimental exploration of the correlation coefficient of static speckles in Fresnel configuration

Li, Dayan; Kelly, Damien P.; Sheridan, John T.

作者Li, Dayan; Kelly, Damien P.; Sheridan, John T.
卷第8133卷
印刷ISSN0277-786X
文件大小659.87KB
发表时间2011
DOI10.1117/12.895541

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