Aberration Corrected STEM-EELS: Applications to Magnetic Materials
- 期刊名称Microscopy and Microanalysis
- 作者Varela, M; Gazquez, J; Bruno, F; Garcia-Barriocanal, J; Torija, M; Sharma, M; Oxley, M; Prange, M; Pantelides, S; Leighton, C; Leon, C; Santamaria, J; Pennycook, S
- 卷第17卷
- 印刷ISSN1431-9276
- 电子ISSN1435-8115
- 文件大小1186.33KB
- 发表时间2011-7
- DOI10.1017/s1431927611004855
- 页码796-797
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