SPIE Proceedings [SPIE SPIE Defense, Security, and Sensing - Orlando, Florida, United States (Monday 25 April 2011)] Modeling and Simulation for Defense Systems and Applications VI - Applying risk-based M&S VV&A techniques to test and laboratory facilities

• 作者Smith, Jeremy; Kelmelis, Eric J.; Elele, James; Hall, David; Pedriani, Charles
• 卷第8060卷
• 印刷ISSN0277-786X
• 文件大小249.39KB
• 发表时间2011
• DOI10.1117/12.885251