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SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Diffraction efficiencies of holographic laminar and blazed types gratings for use in a flat-field spectrograph in the 50-200 eV range for transmission electron microscopes

SPIE Proceedings [SPIE SPIE Optical Engineering + Applications - San Diego, California, USA (Sunday 21 August 2011)] Advances in X-Ray/EUV Optics and Components VI - Diffraction efficiencies of holographic laminar and blazed types gratings for use in a flat-field spectrograph in the 50-200 eV range for transmission electron microscopes

Imazono, T.; Morawe, Christian; Khounsary, Ali M.; Koike, M.; Kawachi, T.; Goto, Shunji; Koeda, M.; Nagano, T.; Sasai, H.; Oue, Y.; Yonezawa, Z.; Kuramoto, S.; Sano, K.
  • 作者Imazono, T.; Morawe, Christian; Khounsary, Ali M.; Koike, M.; Kawachi, T.; Goto, Shunji; Koeda, M.; Nagano, T.; Sasai, H.; Oue, Y.; Yonezawa, Z.; Kuramoto, S.; Sano, K.
  • 卷第8139卷
  • 印刷ISSN0277-786X
  • 文件大小529.93KB
  • 发表时间2011
  • DOI10.1117/12.893382
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