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In Situ Characterization of Thin Film Growth || Inelastic scattering techniques for in situ characterization of thin film growth: backscatter Kikuchi diffraction

In Situ Characterization of Thin Film Growth || Inelastic scattering techniques for in situ characterization of thin film growth: backscatter Kikuchi diffraction

Ingle, N.J.C.
  • 作者Ingle, N.J.C.
  • 文件大小5389.83KB
  • 发表时间2011
  • DOI10.1533/9780857094957.1.29
  • 页码29-51
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