Thermal Robustness and Improved Electrical Properties of Ultrathin Germanium Oxynitride Gate Dielectric
Kutsuki, Katsuhiro; Hideshima, Iori; Okamoto, Gaku; Hosoi, Takuji; Shimura, Takayoshi; Watanabe, Heiji
- 期刊名称Japanese Journal of Applied Physics
- 作者Kutsuki, Katsuhiro; Hideshima, Iori; Okamoto, Gaku; Hosoi, Takuji; Shimura, Takayoshi; Watanabe, Heiji
- 卷第50卷
- 印刷ISSN0021-4922
- 电子ISSN1347-4065
- 文件大小775.99KB
- 发表时间2011-1-20
- DOI10.1143/JJAP.50.010106