发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) || Atomic Force Microscopy (AFM)

Surface and Thin Film Analysis (A Compendium of Principles, Instrumentation, and Applications) || Atomic Force Microscopy (AFM)

Friedbacher, Gernot; Bubert, Henning

作者Friedbacher, Gernot; Bubert, Henning
文件大小527.65KB
发表时间2011
DOI10.1002/9783527636921.ch29
页码443-464

← 返回【学霸图书馆】主页