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The relationship between superhardness effect and modulation structure in VC/TiN nanomultilayers

The relationship between superhardness effect and modulation structure in VC/TiN nanomultilayers

Yuge Li; Guanqun Li; Duo Yang; Geyang Li
  • 作者Yuge Li; Guanqun Li; Duo Yang; Geyang Li
  • 卷第80卷
  • 印刷ISSN0167-577X
  • 文件大小628.20KB
  • 发表时间2012
  • DOI10.1016/j.matlet.2012.04.094
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