The relationship between superhardness effect and modulation structure in VC/TiN nanomultilayers
Yuge Li; Guanqun Li; Duo Yang; Geyang Li
- 作者Yuge Li; Guanqun Li; Duo Yang; Geyang Li
- 卷第80卷
- 印刷ISSN0167-577X
- 文件大小628.20KB
- 发表时间2012
- DOI10.1016/j.matlet.2012.04.094