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[IEEE 2012 IEEE 27th Convention of Electrical & Electronics Engineers in Israel (IEEEI 2012) - Eilat, Israel (2012.11.14-2012.11.17)] 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel - Substantiation of sequential test parameters for mass-produced electronic devices

[IEEE 2012 IEEE 27th Convention of Electrical & Electronics Engineers in Israel (IEEEI 2012) - Eilat, Israel (2012.11.14-2012.11.17)] 2012 IEEE 27th Convention of Electrical and Electronics Engineers in Israel - Substantiation of sequential test parameters for mass-produced electronic devices

Michlin, Y. H.; Shaham, O.; Lumelskii, Ya. P.

作者Michlin, Y. H.; Shaham, O.; Lumelskii, Ya. P.
文件大小774.83KB
发表时间2012
DOI10.1109/eeei.2012.6376986
页码1-5

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