Self-stigma of mental illness scale—short form: Reliability and validity
Patrick W. Corrigan; Patrick J. Michaels; Eduardo Vega; Michael Gause; Amy C. Watson; Nicolas Rüsch
- 作者Patrick W. Corrigan; Patrick J. Michaels; Eduardo Vega; Michael Gause; Amy C. Watson; Nicolas Rüsch
- 卷第199卷
- 期第1期
- 文件大小153.51KB
- 发表时间2012
- DOI10.1016/j.psychres.2012.04.009