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Reconstructed silicon surfaces for calibration of scanning tunnel microscopes

Reconstructed silicon surfaces for calibration of scanning tunnel microscopes

A. Yu. Kuzin, P. A. Todua, V. I. Panov, A. I. Oreshkin

作者A. Yu. Kuzin, P. A. Todua, V. I. Panov, A. I. Oreshkin
卷第55卷
期第7期
文件大小284.41KB
发表时间2012-10
DOI10.1007/s11018-012-0037-5
页码773-779

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