Impact of DoS changes on resistance drift and threshold switching in amorphous phase change materials

• 作者Daniel Krebs; Rüdiger M. Schmidt; Josef Klomfaβ; Jennifer Luckas; Gunnar Bruns; Carl Schlockermann; Martin Salinga; Reinhard Carius; Matthias Wuttig
• 卷第358卷
• 期第17期
• 文件大小3527.67KB
• 发表时间2012
• DOI10.1016/j.jnoncrysol.2011.12.112