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Thermal instability effects in SiC Power MOSFETs

Thermal instability effects in SiC Power MOSFETs

Alberto Castellazzi; Tsuyoshi Funaki; Tsunenobu Kimoto; Takashi Hikihara

作者Alberto Castellazzi; Tsuyoshi Funaki; Tsunenobu Kimoto; Takashi Hikihara
卷第52卷
文件大小1088.86KB
发表时间2012
DOI10.1016/j.microrel.2012.06.096

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