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Backend dielectric reliability simulator for microprocessor system

Backend dielectric reliability simulator for microprocessor system

Chang-Chih Chen; Fahad Ahmed; Dae Hyun Kim; Sung Kyu Lim; Linda Milor

作者Chang-Chih Chen; Fahad Ahmed; Dae Hyun Kim; Sung Kyu Lim; Linda Milor
卷第52卷
文件大小1081.44KB
发表时间2012
DOI10.1016/j.microrel.2012.07.002

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