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[IEEE 2012 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Tunis, Tunisia (2012.05.16-2012.05.18)] 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Test vector embedding in accumulators with stored carry in O(1) time

[IEEE 2012 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era (DTIS) - Tunis, Tunisia (2012.05.16-2012.05.18)] 7th International Conference on Design & Technology of Integrated Systems in Nanoscale Era - Test vector embedding in accumulators with stored carry in O(1) time

Voyiatzis, I.; Efstathiou, C.; Sgouropoulou, C.

作者Voyiatzis, I.; Efstathiou, C.; Sgouropoulou, C.
文件大小241.60KB
发表时间2012
DOI10.1109/DTIS.2012.6232976
页码1-6

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