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[IEEE IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics - Montreal, QC, Canada (2012.10.25-2012.10.28)] IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society - Invariant and reduced features for Fingerprint Characterization

[IEEE IECON 2012 - 38th Annual Conference of IEEE Industrial Electronics - Montreal, QC, Canada (2012.10.25-2012.10.28)] IECON 2012 - 38th Annual Conference on IEEE Industrial Electronics Society - Invariant and reduced features for Fingerprint Characterization

Balti, Ala; Sayadi, Mounir; Fnaiech, Farhat

作者Balti, Ala; Sayadi, Mounir; Fnaiech, Farhat
文件大小1061.09KB
发表时间2012
DOI10.1109/iecon.2012.6388514
页码1530-1534

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