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Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy

Three-dimensional observation of SiO2 hollow spheres with a double-shell structure using aberration-corrected scanning confocal electron microscopy

Zhang, X.; Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Wang, P.; Nellist, P. D.; Kirkland, A. I.; Tezuka, M.; Shimojo, M.
  • 期刊名称Journal of Electron Microscopy
  • 作者Zhang, X.; Takeguchi, M.; Hashimoto, A.; Mitsuishi, K.; Wang, P.; Nellist, P. D.; Kirkland, A. I.; Tezuka, M.; Shimojo, M.
  • 印刷ISSN0022-0744
  • 电子ISSN1477-9986
  • 文件大小345.09KB
  • 发表时间2012-03-29
  • DOI10.1093/jmicro/dfs039
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