![In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational Estimations]()
In Flight SEU/MCU Sensitivity of Commercial Nanometric SRAMs: Operational EstimationsArtola, Laurent; Velazco, Raoul; Hubert, Guillaume; Duzellier, Sophie; Nuns, Thierry; Guerard, Bruno; Peronnard, Paul; Mansour, Wassim; Pancher, Fabrice; Bezerra, Francoise · IEEE Transactions on Nuclear Science · 2011