[IEEE 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Huntington Beach, CA, USA (2012.11.9-2012.11.10)] 2012 IEEE International High Level Design Validation and Test Workshop (HLDVT) - Constrained signal selection for post-silicon validation
Basu, Kanad; Mishra, Prabhat; Patra, Priyadarsan
- 作者Basu, Kanad; Mishra, Prabhat; Patra, Priyadarsan
- 文件大小400.12KB
- 发表时间2012
- DOI10.1109/hldvt.2012.6418245
- 页码71-75