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Testing ADC Spectral Performance Without Dedicated Data Acquisition

Testing ADC Spectral Performance Without Dedicated Data Acquisition

Duan, Jingbo; Jin, Le; Chen, Degang
  • 期刊名称IEEE Transactions on Instrumentation and Measurement
  • 作者Duan, Jingbo; Jin, Le; Chen, Degang
  • 卷第61卷
  • 期第11期
  • 印刷ISSN0018-9456
  • 电子ISSN1557-9662
  • 文件大小1606.37KB
  • 发表时间2012-11
  • DOI10.1109/tim.2012.2202949
  • 页码2941-2952
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