Optical modeling and experimental verification of light induced phenomena in In-Ga-Zn-O thin film transistors with varying gate insulator thickness

• 期刊名称Journal of Applied Physics
• 作者Chung, Yoon Jang; Kim, Jeong Hwan; Kim, Un Ki; Rha, Sang Ho; Hwang, Eric; Hwang, Cheol Seong
• 卷第111卷
• 期第2期
• 印刷ISSN0021-8979
• 文件大小2240.84KB
• 发表时间2012
• DOI10.1063/1.3679522