[IEEE 2012 IEEE International Conference on Imaging Systems and Techniques (IST) - Manchester, United Kingdom (2012.07.16-2012.07.17)] 2012 IEEE International Conference on Imaging Systems and Techniques Proceedings - Total variation image reconstruction for electrical capacitance tomography
Chandrasekera, Thusara C.; Li, Yi; Dennis, John S.; Holland, Daniel J.
- 作者Chandrasekera, Thusara C.; Li, Yi; Dennis, John S.; Holland, Daniel J.
- 文件大小739.46KB
- 发表时间2012
- DOI10.1109/ist.2012.6295573
- 页码584-589