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[IEEE 2012 IEEE International Conference on Imaging Systems and Techniques (IST) - Manchester, United Kingdom (2012.07.16-2012.07.17)] 2012 IEEE International Conference on Imaging Systems and Techniques Proceedings - Total variation image reconstruction for electrical capacitance tomography

[IEEE 2012 IEEE International Conference on Imaging Systems and Techniques (IST) - Manchester, United Kingdom (2012.07.16-2012.07.17)] 2012 IEEE International Conference on Imaging Systems and Techniques Proceedings - Total variation image reconstruction for electrical capacitance tomography

Chandrasekera, Thusara C.; Li, Yi; Dennis, John S.; Holland, Daniel J.
  • 作者Chandrasekera, Thusara C.; Li, Yi; Dennis, John S.; Holland, Daniel J.
  • 文件大小739.46KB
  • 发表时间2012
  • DOI10.1109/ist.2012.6295573
  • 页码584-589
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