发现好书期刊，享受阅读乐趣

海量图书期刊资源，随时随地畅享阅读乐趣

[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - Influence of waveguide width errors on TRL and LRL calibrations

[IEEE 2012 79th ARFTG Microwave Measurement Conference (ARFTG) - Montreal, QC, Canada (2012.06.22-2012.06.22)] 79th ARFTG Microwave Measurement Conference - Influence of waveguide width errors on TRL and LRL calibrations

Stenarson, J.; Yhland, K.; Do, T. N. T.; Zhao, H.; Sobis, P.; Stake, J.

作者Stenarson, J.; Yhland, K.; Do, T. N. T.; Zhao, H.; Sobis, P.; Stake, J.
文件大小815.40KB
发表时间2012
DOI10.1109/arftg79.2012.6291182
页码1-3

← 返回【学霸图书馆】主页